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University of Nebraska–Lincoln

Nebraska Center for Materials and Nanoscience

Faculty - Research Spotlight - Mathias Schubert

Dr. Mathias Schubert has joined the University of Nebraska Lincoln in January 2006 as associate professor in the Department of Electrical Engineering and as a new member of the Nebraska Center for Materials and Nanoscience. Prior to Dr. Schubert’s association with UNL he was at the assistant professor level within the Faculty of Physics and Geosciences at the University of Leipzig, Germany, where he received his physics diploma (1994), doctoral degree (1997), Habilitation and Privatdozent (2003).
Mathias Schubert

Dr. Schubert takes an electromagnetic perspective on the vast realm of new materials in the nanotechnology era. “Albeit a century passed since the electron theory of Paul Drude, understanding the physics behind optical observations from these new materials is of highest importance and still most challenging to us,” Dr. Schubert said. The interrelation between electrical and optical properties of matter has spurred many researchers to use optical tools for understanding and subsequent tailoring of materials properties. Brought upon recent progress in fabrication techniques three-dimensional nanostructures, which may incorporate inorganic and organic materials with highly anisotropic dielectric, semiconducting, ferroelectric, and magnetic properties, for example, are now at hand.
The Leipzig group of Dr. Schubert has progressed an advanced polarization spectroscopy technique: Generalized Ellipsometry. Part of this development occurred during long-term collaborations between the University of Leipzig and Professor John Woollam’s group here at UNL, and which started in 1993 when Dr. Schubert visited Nebraska for the first time as graduate student. “We envisioned ellipsometry as a tool for understanding material properties and physics of nanostructure composites – inaccessible so far to micro- and nanostructure characterization tools.” The first successful applications of their new technique were chiral liquid crystals, the working horse of today’s display technology. “With ellipsometry we can read the kinetics and orientation of the nanometer-sized molecules, for example, without physically contacting or destroying the sample.” If brought into magnetic fields free charge carriers within the nanostructures reveal their mobility and inertial mass parameters by using Far-infrared Magneto-optic Generalized Ellipsometry, a tool which Dr. Schubert's group had just recently invented. Presently the group is building a unique Terahertz Ellipsometer at UNL, which will enable them to investigate charge carriers in their quantum limit. Nanostructures combining ferroelectric with semiconducting and ferromagnetic properties for new device applications in data storage and display vision comprise another research area of his group. “I am very glad about the opportunity to collaborate with the NCMN researchers and I look forward to very exciting research work.”
Dr. Schubert has published one textbook, three book chapters, 130 peer-reviewed journal papers and 170 presentations in international conferences including 17 invited talks. He serves as topical editor for the Optical Society of America. He received research fellowships from the German Merit Foundation, the Swedish Foundation for International Cooperation in Research and Higher Education, the Université Pierre et Marie Curie in Paris, and UNL. He is a member of the German Physical Society, the German University Lecturer Society, and the Materials Research Society. Dr. Schubert participated in 7 international conference committees, and he is an organizer of the next International Ellipsometry Conference in Stockholm. He is a founder and executive board member of the German Ellipsometrie Association. So far, Dr. Schubert has received research grants from the German National Science Foundation, Department of Education and Research, and industry, with a total amount over $1.200,000.
Beginning Spring 2006, Dr. Schubert offers a new course, Optics in Complex Mediums, which covers the area of Optics and Electromagnetism related to nanostructure materials and measurement techniques.

(Spring 2006)